Product Details
Product Description
Product Description
Focus on DCS, PLC, robot control system and large servo system.
Main products: various modules / cards, controllers, touch screens, servo drivers.
Advantages: supply of imported original products, professional production parts,
Fast delivery, accurate delivery time,
The main brands include ABB Bailey, Ge / fuanc, Foxboro, Invensys Triconex, Bently, A-B Rockwell, Emerson, ovation, Motorola, xyvom, Honeywell, Rexroth, KUKA, Ni, Deif, Yokogawa, Woodward, Ryan, Schneider, Yaskawa, Moog, prosoft and other brands
3BSE018105R1
Where: AZmp = Effective repair rate of main processor State 11- Power Supply State 11 is the failure of one of the dual power supplies in a channel. The transition from the initial state to the intermediate state is given by: k1,1 = 2 l X•s The transition from the intermediate state to the initial state representing the repair of the initial failure is given by: k11,1 = / The transition from the intermediate state to a spurious trip representing failure of the remaining power supply in the channel is given by: k11, 12 = s Where: 1 = Number of power supplies per channel XS = Safe failure rate for power supply M =ps Effective repair rate of power supply Effects of Common Cause Failures The effects of dual or triple mode failure is modeled directly as a transition from the initial state to the spurious trip state. The common cause failure includes two factors. The first factor (P3) is for the chance of the remaining two channels failing after the first channel fails. Three safe failures or three dangerous detected failures of any channel would cause a spurious trip. The second factor (P2) is for the chance of a second channel failing after the first fails. Two safe undetected failures could cause a spurious trip. Since no clear software model exists, the software contribution to common cause failure is not modeled or included. The common cause failure transition is given by: MPR Associates, Inc. F M PR 320 King Street Alexandria, VA 22314 Calculation No. / Prered By Checke~I By PreIL Page 12 426-001-CBS-01 k1, 3 P 3 [XPADUmp+ n (Xi ADU + - DU)+ _- "DU m X. - X + - ni nI + ) na (Aipa Di a ica ica n -i ica) md (-.pd - XDopd + no . -nod oDU o) + 3 P2 [-SUmp + nd (-SUipd + ni Xsui) + na (Aipa + ni • suipa) + md (XSUpd + nod .SUod)] + 2 P2 1 •.• Where: P2 - Fraction of single module or circuit failures that result in the failure of an additional module or circuit performing the same function as the original failure P3 = Fraction of single module or circuit failures that result in the failure of two additional modules or circuits performing the same function as the original failure m = Total failure rate of main processor XD5 = Dangerous undetected failure rate of main processor ASU mp Safe undetected failure rate of main processor A = Total failure rate of digital input microprocessor Xu Dangerous undetected failure rate of analog input microprocessor XSU ip Safe undetected failure rate of analog input microprocessor X = Total failure rate of digital input circuit .DU i=d Dangerous undetected failure rate of analog input circuit ).SU Safe undetected failure rate of analog input circuit XA = Total failure rate of analog input microprocessor TaI p Dangerous undetected failure rate of analog input microprocessor ASU aD Safe undetected failure rate of analog input microprocessor X.SSaf Total failure rate of analog input circuit mo_ 'DUi = Dangerous undetected failure rate of analog input circuit ASUica = Safe undetected failure rate of analog input circuit A = Total failure rate of digital output microprocessor ISU Dangerous undetected failure rate of digital output microprocessor Xsu opd Safe undetected failure rate of digital output microprocessor .o=d Total failure rate of digital output circuit xDUoc - Dangerous undetected failure rate of digital output circuit .SU = Safe undetected failure rate of digital output circuit X = Total failure rate of power supply
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